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Process for recording fragment ions in reflector-time of flight mass spectrometers comprises raising the potential to accelerate the parent and fragment ions to be investigated using an acceleration field to focus the speed of the ions
Process for recording fragment ions in reflector-time of flight mass spectrometers comprises raising the potential to accelerate the parent and fragment ions to be investigated using an acceleration field to focus the speed of the ions
Process for recording fragment ions produced by spectra metastable or collision induced from parent ions in reflector-time of flight mass spectrometers comprises raising the potential to accelerate the parent and fragment ions to be investigated using an acceleration field to focus the speed of the ions. An Independent claim is also included for a time of flight mass spectrometer comprising an ion source (1, 2, 3) with a voltage supply for the ion source and a supply unit for an acceleration voltage, an ion selector (4), a potential hoist, a reflector, and a detector.
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