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APPARATUS AND METHOD FOR MEASURING INTERMOLECULAR INTERACTIONS BY ATOMIC FORCE MICROSCOPY.
APPARATUS AND METHOD FOR MEASURING INTERMOLECULAR INTERACTIONS BY ATOMIC FORCE MICROSCOPY.
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机译：用原子力显微镜测量分子间相互作用的装置和方法。
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摘要
A sample support member for atomic force microscopy of intermolecular interactions includes a sample support base (40) having a plurality of protrusions (45), each protrusion (45) having an apical substrate region (48) or tip that has been chemically modified by the immobilization thereon of a sample compound (50) or of a linking compound that is capable of binding a sample compound. A reference compound support member (10), shaped as a cantilever, has a surface region (20) having at least one reference compound (30) immobilized thereon. A physical parameter associated with the interaction between the reference compound (20) and the sample compound (50) can be measured while controlling the spacing between the two support members.
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