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Statistical process control integration systems and methods for monitoring manufacturing processes

机译:统计过程控制集成系统和监视制造过程的方法

摘要

A method and system for monitoring process parameters associated with a manufacturing or testing process. The system includes: at least one machine which is used in the manufacturing or testing process; at least one sensing device, coupled to the at least one machine, for measuring a process parameter associated with the at least one machine; and a controller, coupled to the at least one sensing device, for receiving and storing measured data from the at least one sensing device. The method includes the acts of: measuring a value of a process parameter associated with a machine used in the manufacturing or testing process; converting the measured value of the process parameter into a digital data signal having a specified data format; transmitting the digital data signal to a controller; and storing the digital data signal in a database.
机译:一种用于监视与制造或测试过程相关的过程参数的方法和系统。该系统包括:至少一台用于制造或测试过程的机器;至少一传感装置,其耦接至至少一台机器,用以测量与至少一台机器相关的过程参数;控制器,耦接至至少一感测装置,用以接收并储存来自至少一感测装置的测量数据。该方法包括以下作用:测量与在制造或测试过程中使用的机器相关的过程参数的值;将过程参数的测量值转换为具有指定数据格式的数字数据信号;将数字数据信号发送到控制器;将数字数据信号存储在数据库中。

著录项

  • 公开/公告号US6445969B1

    专利类型

  • 公开/公告日2002-09-03

    原文格式PDF

  • 申请/专利权人 CIRCUIT IMAGE SYSTEMS;

    申请/专利号US19980005259

  • 发明设计人 JIM KENNEY;JOHN LEON;

    申请日1998-01-09

  • 分类号G06F190/00;

  • 国家 US

  • 入库时间 2022-08-22 00:47:25

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