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Device and method for testing a device through resolution of data into atomic operations
Device and method for testing a device through resolution of data into atomic operations
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机译：通过将数据解析为原子操作来测试设备的设备和方法
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摘要
A method of testing a device includes monitoring an output of the device, wherein the output is generated by the device in response to an applied test command; and resolving the output into atomic operations, wherein the atomic operations are substantially the smallest constituent operations which are substantially independent of the device. The method is used to provide a simple, comprehensive test environment that effectively tests 1394a and 1394-1995 designs, for example, in Verilog. The test environment contains rules which completely characterize the behavior of different 1394 bus protocols as defined by the IEEE specifications. The test environment provides portability between different devices under test and between different protocols, automated closed-loop reconciliation of test commands and protocol requirements, topology independence, and out-of-order execution of instructions or relative sequencing. The test environment further allows failure injection, and separate and independent design of the device and a test system.
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机译：一种测试设备的方法，包括监视该设备的输出，其中该输出是由该设备响应于所施加的测试命令而产生的;以及将输出解析为原子操作，其中原子操作是基本上独立于设备的最小的组成操作。该方法用于提供一个简单，全面的测试环境，该环境可以有效地测试1394 a 和1394-1995设计，例如在Verilog中。测试环境包含规则，这些规则完全表征了IEEE规范定义的不同1394总线协议的行为。测试环境提供了在不同被测设备之间以及在不同协议之间的可移植性，测试命令和协议要求的自动闭环协调，拓扑独立性以及指令或相对顺序的无序执行。测试环境还允许故障注入，以及设备和测试系统的独立设计。
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