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首页> 外国专利> Method of testing memory device, method of manufacturing memory device, apparatus for testing memory device, method of testing memory module, method of manufacturing memory module, apparatus for testing memory module and method of manufacturing computer

Method of testing memory device, method of manufacturing memory device, apparatus for testing memory device, method of testing memory module, method of manufacturing memory module, apparatus for testing memory module and method of manufacturing computer

机译：测试存储设备的方法，制造存储设备的方法，用于测试存储设备的设备，测试存储模块的方法，制造存储模块的方法，用于测试存储模块的设备和制造计算机的方法

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摘要

A memory test system can screen objects of tests accurately at low cost in quasi-operating conditions by utilizing a personal computer. The system utilizes a PC tester comprising a measurement PC unit that carries a memory module to be used as reference; a signal distribution unit for distributing the signal taken out from the measurement PC unit; a plurality of PFBs mounted with respective objected products to be observed simultaneously by using the signals distributed by the signal distribution unit; a display panel for displaying the current status of the test that is being conducted; a power source for producing the operating voltage of the system; and a control PC for controlling the selection of test parameters and various analytical operations. The PC tester is adapted to take out the signal from the chip set LSI on the PC mother board in the measurement PC unit to the individual memories on the memory module or the memory module per se and test them in quasi-operating conditions.
机译：存储器测试系统可以通过使用个人计算机以低成本在准操作条件下准确地筛选测试对象。该系统利用一个PC测试仪，该PC测试仪包括一个测量PC单元，该PC单元带有一个用作参考的存储模块。信号分配单元，用于分配从测量PC单元取出的信号;通过使用信号分配单元分配的信号，同时安装有多个被观察对象产品的PFB;显示面板，用于显示正在进行的测试的当前状态;用于产生系统的工作电压的电源;以及用于控制测试参数选择和各种分析操作的控制PC。 PC测试仪适于从测量PC单元中的PC母板上的芯片组LSI取出信号到存储模块或存储模块本身上的各个存储器，并在准操作条件下对其进行测试。

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