首页> 外国专利> STATIC ELECTRICITY EVALUATION SUBSTRATE FOR PLANAR DISPLAY ELEMENT MANUFACTURING DEVICE AND STATIC ELECTRICITY EVALUATION METHOD FOR PLANAR DISPLAY ELEMENT MANUFACTURING DEVICE

STATIC ELECTRICITY EVALUATION SUBSTRATE FOR PLANAR DISPLAY ELEMENT MANUFACTURING DEVICE AND STATIC ELECTRICITY EVALUATION METHOD FOR PLANAR DISPLAY ELEMENT MANUFACTURING DEVICE

机译:平面显示元件制造装置的静电评估基板及平面显示元件制造装置的静电评估方法

摘要

PROBLEM TO BE SOLVED: To prevent defects due to static electricity generated at the time of manufacturing a planar display element, to improve the display quality even for a large-sized, high definition and high image quality planar display element and to reduce costs by improving a manufacture yield.;SOLUTION: A static electricity evaluation substrate 10 composed by enclosing a liquid crystal composition 18 in a gap surrounded by a sealing agent 17 between first and second transparent glass plates 11 and 12 composed by oppositely arranging alignment layers 14 and 16 in the almost same size as a liquid crystal display element to be actually manufactured is made to flow along the manufacturing process of a planar display element manufacturing device. The change of light transmissivity on the static electricity evaluation substrate 10 generated by the static electricity generated at the time of making it flow is observed, the generation condition of the static electricity in the manufacturing process is accurately recognized and appropriate measures against the static electricity are taken.;COPYRIGHT: (C)2002,JPO
机译:要解决的问题:为了防止由于制造平面显示元件时产生的静电而引起的缺陷,即使对于大尺寸,高清晰度和高图像质量的平面显示元件,也要提高显示质量,并通过改进来降低成本SOLUTION:静电评估基板10,该液晶评估基板10是通过将液晶组合物18封闭在第一和第二透明玻璃板11和12之间的密封剂17包围的间隙中而形成的,该间隙通过在基板中相对地排列取向层14和16而构成。使与实际上要制造的液晶显示元件几乎相同的尺寸沿着平面显示元件制造装置的制造工艺流动。观察由在其流动时产生的静电所产生的静电评估基板10上的透光率的变化,可以准确地识别制造过程中静电的产生条件,并且可以采取适当的静电对策。拍摄;版权:(C)2002,日本特许厅

著录项

  • 公开/公告号JP2002296559A

    专利类型

  • 公开/公告日2002-10-09

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;

    申请/专利号JP20010097471

  • 发明设计人 OTAGURO HIROSHI;SEKIUCHI SUENOBU;

    申请日2001-03-29

  • 分类号G02F1/13;G02F1/1343;

  • 国家 JP

  • 入库时间 2022-08-22 00:54:23

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