首页> 外国专利> SPECTROMETRIC ANALYSIS APPARATUS AND LASER RAMAN SPECTROMETRIC ANALYSIS DEVICE, AND SPECTROMETRIC ANALYSIS METHOD USING THE SAME

SPECTROMETRIC ANALYSIS APPARATUS AND LASER RAMAN SPECTROMETRIC ANALYSIS DEVICE, AND SPECTROMETRIC ANALYSIS METHOD USING THE SAME

机译:光谱分析装置和激光拉曼光谱分析装置以及使用其的光谱分析方法

摘要

PROBLEM TO BE SOLVED: To provide a spectrometric analysis apparatus, capable of preventing decrease in S/N due to optical contamination by a scattered light, except the sample and to provide a spectrometric analysis method capable of accurately measuring with good reproducibility, even when an object to be measured is an trace amount and a peak itself of a spectrum is small.;SOLUTION: The spectrometric analysis apparatus comprises an electromagnetic wave generator 2 for emitting an electromagnetic wave having a wavelength specific to the sample S, and an electromagnetic wave detector 6 emitted with the wave from the generator 2, to detect the wave crossing the sample S or refracting or the wave scattered from the sample S. In this apparatus, a periphery 6e of the detector 6 can be masked suitably.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:提供一种光谱分析装置,该光谱分析装置能够防止由于除样品以外的散射光引起的光污染而导致的信噪比降低,并且提供一种即使在分析时也能够以良好的再现性进行准确测量的光谱分析方法。光谱分析装置包括电磁波产生器2和电磁波检测器,该电磁波产生器2发射具有特定于样品S的波长的电磁波,该电磁波产生器2用于发射具有特定于样品S的波长的电磁波。如图6所示,从发生器2发射的波被发射,以检测穿过样品S的波或折射或从样品S散射的波。在该装置中,检测器6的外围6e可以被适当地遮盖。日本特许厅

著录项

  • 公开/公告号JP2002055044A

    专利类型

  • 公开/公告日2002-02-20

    原文格式PDF

  • 申请/专利权人 TOSHIBA CERAMICS CO LTD;

    申请/专利号JP20000239934

  • 发明设计人 HAMANO TSUTOMU;

    申请日2000-08-08

  • 分类号G01N21/27;G01J3/28;G01J3/44;G01N21/65;

  • 国家 JP

  • 入库时间 2022-08-22 00:56:40

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