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METHOD OF TESTING LVDS RECEIVER WITH BUILT-IN INTEGRATED CIRCUIT, TESTING CIRCUIT THEREOF AND TESTER THEREOF
METHOD OF TESTING LVDS RECEIVER WITH BUILT-IN INTEGRATED CIRCUIT, TESTING CIRCUIT THEREOF AND TESTER THEREOF
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机译：用内置集成电路测试LVDS接收器的方法，测试电路和测试器的方法
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摘要
PROBLEM TO BE SOLVED: To enable the product inspection of ASICs including LVDS receivers by generating only digital signals from an LSI tester.;SOLUTION: LVDS transmitter 4 is connected to a digital output terminal of a general purposed LSI tester 1 and its output is applied to an LVDS signal input 3a of an ASIC 2. The LVDS transmitter 4 converts a digital signal from the LSI tester 1 to an LVDS signal.;COPYRIGHT: (C)2002,JPO
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