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Crystal lattice plane survey instrument of monocrystal sample and taxonomic device null of monocrystal
Crystal lattice plane survey instrument of monocrystal sample and taxonomic device null of monocrystal
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机译：单晶样品的晶格面测量仪及单晶分类装置的失效
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摘要
PURPOSE: To perform measurement in an extremely short time when orientation measurement of a crystal lattice surface is performed in sequence in relation to multiple single crystal samples. ;CONSTITUTION: An X-ray emitted from an X-ray source 5 is divided into two upper and lower X-ray beams R11, R12. The R11 is applied to a single crystal sample 1 retained by an in-plane rotation device 13 and the R12 is applied to another single crystal sample 1 retained by an ω rotation goniometer 15. By conducting X-ray diffraction measurement while the single crystal sample 1 is being in-plane rotated by the in-plane rotation device 13, the inclination direction of a crystal lattice surface in the single crystal sample 1 relative to the X-ray beam R11 is arranged in the fixed direction. By conducting the X-ray diffraction measurement while the single crystal sample 1 is being ωrotated and oscillated around a horizontal axis L2 by the ω rotation goniometer 15, inclination angle deviation of crystal lattice surface is obtained. The single crystal sample 1 is classified for each obtained angle deviation and stored in a corresponding classification box 42.;COPYRIGHT: (C)1994,JPO&Japio
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