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Methods and systems for testing integrated circuit memory devices by overlappiing test result loading and test result analysis
Methods and systems for testing integrated circuit memory devices by overlappiing test result loading and test result analysis
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机译：通过重叠加载测试结果和测试结果分析来测试集成电路存储器件的方法和系统
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摘要
Integrated circuit memory devices are tested by loading into a first defect interpretation memory, results of a preceding comparison test between test pattern data that is input into a memory device and resultant data that is output from the memory device. Automatic switching then takes place to a second defect interpretation memory. The results of a succeeding comparison test are loaded therein, while simultaneously analyzing results from the preceding comparison test in the first defect interpretation memory. Then, automatic switching back to the first defect interpretation memory takes place, and results of a next succeeding comparison test are loaded therein while simultaneously analyzing the results from the succeeding comparison test in the second defect interpretation memory. Automatic switching and automatic switching back are repeatedly performed, to thereby simultaneously test a memory device and analyze memory test results.
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