首页> 外国专利> Potential measurement method for determining several phase potentials, by means of field measurements and calculation using coupling coefficients derived from measurements taken with only one phase energized

Potential measurement method for determining several phase potentials, by means of field measurements and calculation using coupling coefficients derived from measurements taken with only one phase energized

机译:用于确定多个相电势的电势测量方法,该方法通过现场测量和使用耦合系数来计算,该耦合系数由仅在一个相通电的情况下进行的测量得出

摘要

With the method, before measurements are taken, possibly before commissioning, one phase busbar is energized at a known potential. From the measurements taken by the individual field sensors coupling coefficients are derived relating to the degree to which they are affected by the field generated by the other phases.
机译:使用该方法,在进行测量之前(可能在调试之前),以已知电位为一相母线通电。从各个场传感器获得的测量结果中,得出耦合系数与它们受其他相位产生的场的影响程度有关。

著录项

  • 公开/公告号DE10061742A1

    专利类型

  • 公开/公告日2001-10-18

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE2000161742

  • 申请日2000-12-12

  • 分类号G01R19/10;G01R29/12;G01R15/24;

  • 国家 DE

  • 入库时间 2022-08-22 01:09:41

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号