首页> 外国专利> Slit lamp microscope has illumination optical system and image pick-up unit attached to base centering around same axis and display unit attached to base for displaying tested eyes photographed by image pick-up unit

Slit lamp microscope has illumination optical system and image pick-up unit attached to base centering around same axis and display unit attached to base for displaying tested eyes photographed by image pick-up unit

机译：裂隙灯显微镜具有照明光学系统，以同一轴为中心安装在基座上的摄像单元，以及安装在基座上的用于显示摄像单元拍摄的被检眼的显示单元。

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摘要

The illumination optical system projecting slit light on the tested eyes and image pick-up unit photographing the illuminated eyes, are attached in the base rotatably centering around the same axis. Display unit (30) displaying the tested eyes photographed by the image pick-up unit, is attached to the base.

机译：在被检眼上投射狭缝光的照明光学系统和拍摄被照眼的摄像单元以可绕同一轴线为中心旋转地安装在底座中。显示由摄像单元拍摄的被检眼的显示单元（30）安装在基座上。

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公开/公告号DE10036965A1

专利类型
公开/公告日2001-05-31

原文格式PDF
申请/专利权人 NIDEK CO. LTD.;
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申请/专利号DE2000136965
发明设计人 YOSHIMURA KAZUHIRO;MURAKAMI YASUHISA;
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申请日2000-07-28
分类号A61B3/135;
国家 DE
入库时间 2022-08-22 01:09:44

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