首页> 外国专利> Non-volatile ferroelectric memory comprises partial word lines, bit lines that cut the partial word lines, source/drain impurity regions formed on both sides of the word lines, and ferroelectric capacitors

Non-volatile ferroelectric memory comprises partial word lines, bit lines that cut the partial word lines, source/drain impurity regions formed on both sides of the word lines, and ferroelectric capacitors

机译:非易失性铁电存储器包括部分字线,切割部分字线的位线,形成在字线两侧的源/漏杂质区和铁电电容器

摘要

Non-volatile ferroelectric memory comprises partial word lines (SWL1, SWL2) formed at intervals in one direction; bit lines (B/L1, B/L2) that cut the partial word lines; source/drain impurity regions formed on both sides of the word lines; a first ferroelectric capacitor (FC1); and a second ferroelectric capacitor (FC2). An Independent claim is also included for a non-volatile ferroelectric memory. Preferred Features: The first drain impurity region and the second drain impurity region are electrically connected to the bit lines via a first contact stop layer and as second contact stop layer.
机译:非易失性铁电存储器包括在一个方向上以一定间隔形成的部分字线(SWL1,SWL2);以及部分字线(SWL1,SWL2)。切断部分字线的位线(B / L1,B / L2);在字线的两侧形成的源/漏杂质区;第一铁电电容器(FC1);第二铁电电容器(FC2)。非易失性铁电存储器也包括独立权利要求。优选特征:第一漏极杂质区和第二漏极杂质区通过第一接触停止层和作为第二接触停止层电连接到位线。

著录项

  • 公开/公告号DE10032311A1

    专利类型

  • 公开/公告日2001-02-22

    原文格式PDF

  • 申请/专利权人 HYUNDAI ELECTRONICS INDUSTRIES CO. LTD.;

    申请/专利号DE2000132311

  • 发明设计人 LEE JUN SIK;KANG HEE BOK;

    申请日2000-07-04

  • 分类号H01L27/105;H01L21/8239;

  • 国家 DE

  • 入库时间 2022-08-22 01:09:47

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