首页>
外国专利>
Procedure for identification of integrated circuit by generation of faulty or erroneous memory cells within memory and identification of the circuit from the faulty memory cell pattern, with no need to hard-wire a serial number
Procedure for identification of integrated circuit by generation of faulty or erroneous memory cells within memory and identification of the circuit from the faulty memory cell pattern, with no need to hard-wire a serial number
Identification of an integrated circuit is using a number of erroneous memory cells (7, 8, 9) that are produced during manufacture as an identifying pattern and from which a circuit identification number is produced.
展开▼