首页> 外国专利> Procedure for identification of integrated circuit by generation of faulty or erroneous memory cells within memory and identification of the circuit from the faulty memory cell pattern, with no need to hard-wire a serial number

Procedure for identification of integrated circuit by generation of faulty or erroneous memory cells within memory and identification of the circuit from the faulty memory cell pattern, with no need to hard-wire a serial number

机译:通过在内存中生成故障或错误的存储单元来识别集成电路的过程,以及从故障的存储单元模式中识别电路的过程,而无需对序列号进行硬连线

摘要

Identification of an integrated circuit is using a number of erroneous memory cells (7, 8, 9) that are produced during manufacture as an identifying pattern and from which a circuit identification number is produced.
机译:集成电路的识别使用制造过程中产生的许多错误的存储单元(7、8、9)作为识别图案,并从中产生电路识别号。

著录项

  • 公开/公告号DE19951048A1

    专利类型

  • 公开/公告日2001-04-26

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE19991051048

  • 发明设计人 HARTMANN RALF;

    申请日1999-10-22

  • 分类号G11C29/00;G06F12/14;

  • 国家 DE

  • 入库时间 2022-08-22 01:10:15

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