首页> 外国专利> Procedure for leak testing and repair of damaged pipes entails using leak testing device to determine leak, marking damaged area, and moving combination unit until repair device is located in damaged area

Procedure for leak testing and repair of damaged pipes entails using leak testing device to determine leak, marking damaged area, and moving combination unit until repair device is located in damaged area

机译:进行泄漏测试和维修损坏管道的程序需要使用泄漏测试设备确定泄漏,标记损坏区域并移动组合装置,直到维修设备位于损坏区域中为止

摘要

A leak testing device(30) is used on any point on the pipe(28) to determine its sealing integrity. The device is then moved to another point on the pipe and if a leak is detected the place is marked. The functional unit comprising leak testing device and repair device(35) is then moved until the repair device is in the damaged area by checking the marking. The damaged area is then repaired. After the repair has been carried out the unit is shifted until the leak testing device is in the region of the repair and a further leak test carried. An Independent claim is included for a leak testing device and repair device which forms a functional unit.
机译:在管道(28)的任何一点上使用泄漏测试装置(30)以确定其密封完整性。然后将设备移至管道上的另一点,如果检测到泄漏,则标记该位置。然后,通过检查标记来移动包括泄漏测试装置和修复装置(35)的功能单元,直到修复装置位于受损区域。然后修复受损区域。维修完成后,将设备移至泄漏测试设备在维修范围内,并进行进一步的泄漏测试。构成功能单元的泄漏测试设备和维修设备包括独立索赔。

著录项

  • 公开/公告号DE19948288A1

    专利类型

  • 公开/公告日2001-04-12

    原文格式PDF

  • 申请/专利权人 JT-ELEKTRONIK GMBH;

    申请/专利号DE1999148288

  • 发明设计人 JOECKEL ULRICH;

    申请日1999-10-06

  • 分类号F17D5/02;F16L55/26;F16L55/18;

  • 国家 DE

  • 入库时间 2022-08-22 01:10:17

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