首页> 外国专利> Process for implanting doping materials in a pre-doped silicon carbide substrate used in the production of power diodes comprises producing zones of second conductivity in a substrate of first conductivity and thermally treating

Process for implanting doping materials in a pre-doped silicon carbide substrate used in the production of power diodes comprises producing zones of second conductivity in a substrate of first conductivity and thermally treating

机译:在用于功率二极管生产的预掺杂碳化硅衬底中注入掺杂材料的方法包括在具有第一导电性的衬底中产生具有第二导电性的区域并进行热处理

摘要

Implanting doping materials in a pre-doped SiC substrate (1) comprises producing two second conductivity zones (5, 6) in a first conductivity substrate using mask (2) by implanting materials with different acceleration energy, and heat treating doped and implanted SiC substrate in an oven to cure lattice errors. Zone (5) is more highly doped than the blocking layer edge zone (6) lying below it. Preferred Features: A mask opening is selected during the implantation of the blocking layer edge zone so that it is larger than the highly doped zone (5) and the blocking layer edge zone extends up to the surface of the substrate.
机译:将掺杂材料注入到预先掺杂的SiC衬底中(1)包括通过使用具有不同加速能量的材料注入,使用掩模(2)在第一导电性衬底中产生两个第二导电区域(5、6),并对掺杂和注入的SiC衬底进行热处理在烤箱中解决晶格错误。区域(5)比位于其下方的阻挡层边缘区域(6)掺杂程度更高。优选特征:在注入阻挡层边缘区域的过程中选择掩模开口,以使其比高掺杂区域(5)大,并且阻挡层边缘区域一直延伸到衬底的表面。

著录项

  • 公开/公告号DE19928714A1

    专利类型

  • 公开/公告日2001-01-18

    原文格式PDF

  • 申请/专利权人 DAIMLERCHRYSLER AG;

    申请/专利号DE1999128714

  • 发明设计人 WONDRAK WOLFGANG;SCHMID ULRICH;LAUER VERA;

    申请日1999-06-23

  • 分类号H01L21/266;

  • 国家 DE

  • 入库时间 2022-08-22 01:10:28

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号