首页> 外国专利> Method for determining the emission and absorption levels of objects uses different intensities from a narrow-band radiation source to irradiate a test object in flow-measuring flumes and a sensor to measure an object's radiation.

Method for determining the emission and absorption levels of objects uses different intensities from a narrow-band radiation source to irradiate a test object in flow-measuring flumes and a sensor to measure an object's radiation.

机译：用于确定对象的发射和吸收水平的方法使用来自窄带辐射源的不同强度来照射流量测量槽中的测试对象，以及使用传感器来测量对象的辐射。

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摘要

Different intensities (Se1,Se2) from a narrow-band radiation source (3) irradiate a test object (2) in flow-measuring flumes. A sensor (4) measures total radiation of the object from reflection (Sr1,Sr2) and temperature (S0) radiation as well as direct radiation (SR1,SR2) from the narrow-band radiation source. A difference in test values for the different radiation intensities forms during the calculation of the emission and absorption level.

机译：来自窄带辐射源（3）的不同强度（Se1，Se2）照射到流量测量水槽中的测试对象（2）。传感器（4）测量来自反射（Sr1，Sr2）和温度（S0）辐射的物体的总辐射以及来自窄带辐射源的直接辐射（SR1，SR2）。在计算发射和吸收水平时，会出现不同辐射强度的测试值差异。

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公开/公告号DE19922278A1

专利类型
公开/公告日2000-11-16

原文格式PDF
申请/专利权人 FRIEDRICH-SCHILLER-UNIVERSITAET JENA BUERO FUER FORSCHUNGSTRANSFER;
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申请/专利号DE1999122278
发明设计人 NAGEL SEBASTIAN;KAHLEYS INGOLF;FRIED WOLFGANG;SCHIED RALF;SCHULZE HERBERT;
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申请日1999-05-11
分类号G01J5/58;G01N21/59;G01J5/08;G01N21/62;
国家 DE
入库时间 2022-08-22 01:10:32

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