首页> 外国专利> PARAMETRIC SURFACE EVALUATION IN EIGENSPACE OF SUBDIVISION MATRIX OF IRREGULAR PATCH

PARAMETRIC SURFACE EVALUATION IN EIGENSPACE OF SUBDIVISION MATRIX OF IRREGULAR PATCH

机译:不规则斑块细分矩阵特征空间中的参数表面评估

摘要

A computer-based method for determining a property of a location on a computer surface model where the location is described by a set of parameters and the surface model is described by a set of control vertices having a corresponding set of subdivision rules, and the control vertices admit a parameterization of regular sets of control vertices, includes receiving input specifying coordinates of control vertices that describe the surface model, projecting the specified coordinates of the control vertices into an eigenspace derived from a matrix representation of the subdivision rules to produce a set of projected control vertices, determining which of a hierarchically nested set of regular tiles of the surface model contains the location, and evaluating the location as a function of a valence of one of the control vertices, the determined nested tile, and the set of projected control vertices. The evaluated location is stored in a computer memory.
机译:一种基于计算机的方法,用于确定计算机表面模型上位置的属性,该位置由一组参数描述,而表面模型由一组具有相应细分规则的控制顶点描述,并且该控件顶点允许对常规控制顶点集进行参数化,包括接收指定描述表面模型的控制顶点坐标的输入,将控制顶点的指定坐标投影到由细分规则的矩阵表示得出的本征空间中,以生成一组投影控制顶点,确定表面模型的一组层次嵌套的常规图块中的哪一个包含位置,并根据控制顶点,确定的嵌套图块和投影控件集的化合价评估位置顶点。评估的位置存储在计算机内存中。

著录项

  • 公开/公告号EP1097435A1

    专利类型

  • 公开/公告日2001-05-09

    原文格式PDF

  • 申请/专利权人 SILICON GRAPHICS INC.;

    申请/专利号EP19990935522

  • 发明设计人 STAM JOS;

    申请日1999-07-14

  • 分类号G06T17/20;

  • 国家 EP

  • 入库时间 2022-08-22 01:15:46

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