首页> 外国专利> SUBSTRATE SUCTION HOLDING METHOD, SUBSTRATE SUCTION HOLDING DEVICE, ALIGNER USING THE SUBSTRATE SUCTION HOLDING DEVICE AND MANUFACTURING METHOD THE DEVICE

SUBSTRATE SUCTION HOLDING METHOD, SUBSTRATE SUCTION HOLDING DEVICE, ALIGNER USING THE SUBSTRATE SUCTION HOLDING DEVICE AND MANUFACTURING METHOD THE DEVICE

机译:基板吸持方法,基板吸持设备,使用基板吸持设备的报警器及其制造方法

摘要

PROBLEM TO BE SOLVED: To provide a substrate suction holding method, which obtains the satisfactory planarity of the surface of a substrate, without exerting the effect of the roughness of the rear of the substrate on the surface of the substrate even though the substrate is a substrate, such as a wafer which is large in roughness of its rear surface, and also suction holes the substrate in such a way as to eliminate local strains within the surface of the substrate, and a substrate suction holding device. ;SOLUTION: When a substrate 2 is mounted on protruding parts 3a, formed on a chuck 3 for supporting the substrate 2, such as a wafer, and is suction held on the chuck 3 at a negative pressure, with an electrostatic force or the like, roughness suction member 4 capable of absorbing the roughness of the rear of the substrate are made to be interposed between the upper surfaces of the protruding parts 3a and the rear of the substrate 2. The members 4 are a member, having a longitudinal elastic modulus lower than that of the substrate 2 and the thickness of the members 4, is formed thikcer than 1/2 the PV value of the roughness of the rear surface of the substrate. The members 4 are deformed to fit the roughness of the rear surface of the substrate, the recesses and projections and undulations of the surface of the substrate, which are generated due to the roughness of the rear surface of the substrate, are reduced or relaxed to cause the defocusing of the surface of the substrate and a strain to be reduced within the surface of the substrate.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:提供一种基板吸附保持方法,该方法即使在基板为硬质合金的情况下也能够获得令人满意的基板表面的平坦度,而不会在基板表面上产生基板背面的粗糙度的影响。基板,例如其背面的粗糙度大的晶片,并且以消除基板表面内的局部应变的方式对基板进行吸孔,以及基板吸持装置。 ;解决方案:当将基板2安装在突起部分3a上时,该突起部分3a形成在用于支撑基板2的卡盘3上,例如晶片,并通过静电力等负压抽吸保持在卡盘3上。在突出部3a的上表面与基板2的背面之间夹设有能够吸收基板的背面的粗糙度的粗糙度吸附部件4。部件4是具有纵向弹性模量的部件。厚度小于基板2的厚度和部件4的厚度的厚度形成为小于基板背面的粗糙度的PV值的1/2。使构件4变形以适合基板的后表面的粗糙度,由于基板的后表面的粗糙度而产生的基板表面的凹凸,起伏被减小或松弛到导致基板表面散焦并减小基板表面内的应变。;版权所有:(C)2001,JPO

著录项

  • 公开/公告号JP2001060618A

    专利类型

  • 公开/公告日2001-03-06

    原文格式PDF

  • 申请/专利权人 CANON INC;

    申请/专利号JP19990233589

  • 申请日1999-08-20

  • 分类号H01L21/68;B23Q3/08;G03F7/20;H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-22 01:26:41

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