首页> 外国专利> SAMPLE SURFACE DEPOSIT INSPECTION SYSTEM, SAMPLE SURFACE DEPOSIT INSPECTION METHOD, SAMPLE SURFACE DEPOSIT ELIMINATION SYSTEM, SAMPLE SURFACE DEPOSIT STICKING SYSTEM AND SAMPLE SURFACE DEPOSIT DISPOSAL SYSTEM

SAMPLE SURFACE DEPOSIT INSPECTION SYSTEM, SAMPLE SURFACE DEPOSIT INSPECTION METHOD, SAMPLE SURFACE DEPOSIT ELIMINATION SYSTEM, SAMPLE SURFACE DEPOSIT STICKING SYSTEM AND SAMPLE SURFACE DEPOSIT DISPOSAL SYSTEM

机译:样品表面沉积物检验系统,样品表面沉积物检验方法,样品表面沉积物消除系统,样品表面沉积物粘附系统和样品表面沉积物沉积系统

摘要

PROBLEM TO BE SOLVED: To provide a sample surface deposit inspection system, a deposit elimination system and a deposit sticking system capable of easily detecting deposit even on a rugged sample surface and efficiently eliminating static electric charge to eliminate the deposit from a base. ;SOLUTION: An ultraviolet light source 12 irradiates ultraviolet rays from every angle including the surface and back face of a solid or liquid sample. An optical system 13 converges the ultraviolet rays directly or through a lens or the like to irradiate the sample. An optical mechanism 13 has a measuring mechanism for recording the in-plane distributed image of fluorescent intensity radiated from the sample surface after the irradiation of ultraviolet rays, by an image pickup apparatus or the like, and a magnifying mechanism for the detection of the radiated fluorescence from the local part of the sample surface through a microscope, and guides the radiated fluorescence into a spectroscope 11. A moving mechanism can move these sample stage and observation system precisely in a wide range.;COPYRIGHT: (C)2001,JPO
机译:要解决的问题:提供一种样本表面沉积物检查系统,一种沉积物清除系统和一种沉积物粘附系统,即使在崎sample的样本表面上也能够轻松检测到沉积物,并有效消除静电荷以从基座上清除沉积物。 ;解决方案:紫外线光源12从包括固体或液体样品的表面和背面的每个角度照射紫外线。光学系统13直接或通过透镜等会聚紫外线以照射样品。光学机构13具有:测量机构,其用于通过摄像装置等记录从紫外线照射后的样品表面放射的荧光强度的面内分布图像;以及放大机构,其用于检测放射线。通过显微镜从样品表面的局部发出荧光,并将辐射的荧光引导到分光镜11中。一种移动机制可以使这些样品台和观察系统精确地在很宽的范围内移动。;版权:(C)2001,JPO

著录项

  • 公开/公告号JP2001147198A

    专利类型

  • 公开/公告日2001-05-29

    原文格式PDF

  • 申请/专利权人 KAWAI AKIRA;

    申请/专利号JP19990332081

  • 发明设计人 KAWAI AKIRA;

    申请日1999-11-22

  • 分类号G01N21/88;

  • 国家 JP

  • 入库时间 2022-08-22 01:28:28

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