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ELAPSED TIME DATA COLLECTING METHOD FOR CONTACT RESISTANCE OF RELAY CONTACT AND CONTACT RESISTANCE MEASURING DEVICE FOR RELAY CONTACT USED IN SUCH METHOD

机译：继电器触点接触电阻的耗时数据收集方法及这种方法中使用的继电器触点接触电阻测量装置

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摘要

PROBLEM TO BE SOLVED: To seize the elapsed-time change of the contact resistance of relay contacts without causing troublesome work. ;SOLUTION: A proper number of contact input signal processing circuits 7-1, 7-2...7-n are selected out of contact input signal processing circuits 7-0, 7-1, 7-2...7-n in which relay contacts r-0, r-1, r-2...r-n opened/closed by buffer relays R-0, R-1, R-2...R-n are assembled. Measuring lines 8-1, 8-2...8-n on which sample contacts tr-1, tr-2...tr-n operated in association with the relay contacts r-1, r-2...r-n in the contact input signal processing circuits 7-1, 7-2...7-n are provided are connected in parallel to a measuring power line 10. The contact resistance of the sample contacts in the closed condition is measured for preset time interval and collected as data.;COPYRIGHT: (C)2001,JPO

机译：要解决的问题：在不引起麻烦的情况下，抓住继电器触点的接触电阻随时间的变化。 ;解决方案：从触点输入信号处理电路7-0、7-1、7-2 ... 7-中选择适当数量的触点输入信号处理电路7-1、7-2 ... 7-n n装配了由缓冲继电器R-0，R-1，R-2 ... Rn打开/闭合的继电器触点r-0，r-1，r-2 ... rn。测量线8-1、8-2 ... 8-n，其样品触点tr-1，tr-2 ... tr-n与继电器触点r-1，r-2 ... rn相关联在触点输入信号处理电路7-1、7-2 ... 7-n中设置有与测量电源线10并联连接。在预定的时间间隔内，测量闭合状态下的样品触点的接触电阻。并作为数据收集。版权所有：（C）2001，日本特许厅

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公开/公告号JP2001110267A

专利类型
公开/公告日2001-04-20

原文格式PDF
申请/专利权人 ISHIKAWAJIMA HARIMA HEAVY IND CO LTD;
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申请/专利号JP19990286986
发明设计人 KUBO MASAYA;
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申请日1999-10-07
分类号H01H9/54;G01R27/02;G01R31/00;H01H47/00;
国家 JP
入库时间 2022-08-22 01:29:57

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