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PROCEDURES AND PREPARATION FOR DETERMINING THE SCIENCE, LIKELIHOOD AND/OR CONTACT OF SCIENTIFIC SUBSTREATED SCIENCES

机译:确定科学,亚种和/或接触化学的方法

摘要

The invention relates to a process for determining the layer thickness(es), the heat conductivity(ies) and/or the layer contact quality of layers or layer systems deposited on substrates using photo-thermal means, in which light is directed on the layer to be measured and the time-dependent temperature rise, temperature drop and/or the maximum amplitude is measured photo-thermally by a detector.
机译:本发明涉及一种使用光热装置确定沉积在基板上的层或层系统的层厚度,导热率和/或层接触质量的方法,其中光被引导到该层上进行测量,并随时间变化的温度上升,温度下降和/或最大振幅通过探测器进行光热测量。

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