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System for testing dense connection area arrays has probe tip arrangement with connection area in array and probe tip resistance coupled to connection area and access transfer line
System for testing dense connection area arrays has probe tip arrangement with connection area in array and probe tip resistance coupled to connection area and access transfer line
System has probe tip arrangement for minimizing load on connection area (103) in dense connection area array (100), a probe tip resistance (106) with first end (109) coupled to connection area with the tip resistance immediately adjacent to connection area, and access transfer line coupled to second end (113) of probe tip resistance and extending out of dense array. Independent claims are also included for the following: a probe tip arrangement, a socket and an intermediate circuit.
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