首页>
外国专利>
Apparatus quantifying quality of structured surfaces, employs diverse strategies in transmitting light from source to receiver, to detect and quantify influences including shape, color, reflectance and topology
Apparatus quantifying quality of structured surfaces, employs diverse strategies in transmitting light from source to receiver, to detect and quantify influences including shape, color, reflectance and topology
First and second optical units are so constituted that reflected light is influenced by the surface measured. A unit evaluates the reflected light, from which a structure-moderated property of the surface is characterized. (Note that the word reflected here will not generally imply specular reflection) Preferred features: Light from the first unit is patterned, including light and dark edge(s), running parallel. The light is in a raster, orthogonal grid or circular pattern. A fraction of the total illumination has no pattern. Differences between and gradients from sensor outputs, establish increases in measured signals corresponding with the pattern. From a cross section of the gradients, a structure-dependent characteristic of the surface is determined. The method is further detailed, salient features being summarized in the following. Reflectivity, sheen, and contrast are taken as characteristic. Surface topology (e.g. orange peel effect) is established optionally in two or more wavelengths. The angle(s) of measurement are variable, a stepped progression being suggested. Fresnel reflection is employed. Various forms of optical beam or cone are described. Temperature correction (optical) is included.
展开▼
