首页> 外国专利> METHOD OF MANUFACTURING TITANIUM SALICIDE BY EVAPORATING TITANIUM AND NITRIC TITANIUM

METHOD OF MANUFACTURING TITANIUM SALICIDE BY EVAPORATING TITANIUM AND NITRIC TITANIUM

机译:蒸发钛和氮化钛制造水化钛的方法

摘要

PURPOSE: manufacture Titanium silicide is provided by the titanium of evaporation titanium and nitrogen prevents uniform titanium film from obtaining, and is formed from outside contamination until Titanium silicide by rapid thermal treatment (RTP) by standard sputter method. CONSTITUTION: manufacture Titanium silicide is by the titanium of evaporation titanium and nitrogen comprising steps of evaporation titanium and nitric acid ti thin film layer, pass through entire one gate of silicon wafer of standard sputtering method, active area is formed with one side wall clearance wall and source/drain regions, chip also has isolated area; Formation titanium silicide only has to contact in one side and be formed on titanium film gate electrode and source/drain region on silicon, and the heat treatment (RTP) by executing rapid thermal treatment makes titanium film to the evaporation titanium and nitric acid of silicon wafer; Staying in titanium film with elimination titanium and nitric acid, upper layer silicon wafer and the low-resistance silicide of drop are formed in gate electrode and source/drain regions RTP passes through the process again.
机译:目的:制造硅化钛是由蒸发钛中的钛提供的,而氮会阻止获得均匀的钛膜,并且是由外部污染形成的,直到通过标准溅射法通过快速热处理(RTP)形成硅化钛为止。组成:制造硅化钛是由蒸镀钛和氮的钛组成的蒸镀钛和硝酸钛薄膜层的步骤,通过标准溅射方法的硅晶片的整个一个浇口,有效区域形成有一个侧壁间隙壁在源/漏区,芯片也有隔离区;形成硅化钛仅需在一侧接触并形成在钛膜栅电极和硅上的源/漏区上,通过执行快速热处理的热处理(RTP)使钛膜蒸发硅的钛和硝酸晶圆通过去除钛和硝酸而留在钛膜中,在栅电极中形成上层硅晶片和低电阻的液滴硅化物,并且源/漏区RTP再次通过该工艺。

著录项

  • 公开/公告号KR20000019439A

    专利类型

  • 公开/公告日2000-04-15

    原文格式PDF

  • 申请/专利权人 ANAM SEMICONDUCTOR. LTD.;

    申请/专利号KR19980037551

  • 发明设计人 PARK JIN U;

    申请日1998-09-11

  • 分类号H01L21/203;

  • 国家 KR

  • 入库时间 2022-08-22 01:45:58

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