首页> 外国专利> EVALUATION TECHNIQUE FOR CREEP LIFE BY MAXIMUM VOID GRAIN BOUNDARY OCCUPATION RATE METHOD

EVALUATION TECHNIQUE FOR CREEP LIFE BY MAXIMUM VOID GRAIN BOUNDARY OCCUPATION RATE METHOD

机译:最大空粒子边界占有率法的蠕变寿命评估技术

摘要

PROBLEM TO BE SOLVED: To obtain an evaluation technique in which a creep life consumption rate can be evaluated with high accuracy even by an unskilled operator, by a method wherein the maximum value of the grain boundary occupation rate of a creep void generated in every crystal grain boundary of a member is measured and the creep life consumption rate of a creep-degraded apparatus member is estimated. SOLUTION: A part in which a creep void is recognized is observed at an arbitrary magnification by using a scanning electron microscope, an optical microscope or a laser microscope, and the maximum part of a creep void crystal grain boundary occupation rate within its visual field is measured. The maximum part is fitted to a master curve obtained by an experiment, and the creep life consumption rate of a member is estimated. For example, the ratio of the length l of a creep void on a crystal grain boundary occupied by the length L of a crystal grain boundary in which the creep void exists is calculated, and a maximum void grain boundary occupation rate is found. When the maximum void grain occupation rate is fitted to a master curve obtained by an experiment, the creep life consumption rate of the member to be evaluated can be evaluated, and the consumption rate can be measured every simply even by an unskilled operator.
机译:要解决的问题:获得一种评估技术,其中即使由非熟练操作人员也可以高精度地评估蠕变寿命消耗率,其方法是在每个晶体中产生的蠕变空隙的晶界占有率的最大值测量部件的晶界,并估计蠕变降解的设备部件的蠕变寿命消耗率。解决方案:通过使用扫描电子显微镜,光学显微镜或激光显微镜以任意放大倍率观察到可以识别出蠕变空隙的部分,并且在其视野内最大的蠕变空隙晶界占据率是测量。将最大部分拟合到通过实验获得的主曲线,并估计构件的蠕变寿命消耗率。例如,求出存在于蠕变空隙的晶粒边界的长度L所占的晶粒边界上的蠕变空隙的长度l与存在的比率,求出最大的空隙晶界占有率。将最大空洞占有率与通过实验得到的主曲线拟合时,可以评价被评价部件的蠕变寿命消耗率,即使是非熟练的操作人员也可以简单地测定消耗率。

著录项

  • 公开/公告号JP2000258306A

    专利类型

  • 公开/公告日2000-09-22

    原文格式PDF

  • 申请/专利权人 CHUGOKU ELECTRIC POWER CO INC:THE;

    申请/专利号JP19990101616

  • 发明设计人 NISHIDA HIDETAKA;

    申请日1999-03-05

  • 分类号G01M19/00;

  • 国家 JP

  • 入库时间 2022-08-22 02:03:55

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