首页> 外国专利> METHOD FOR THE QUANTITATIVE DETERMINATION OF ELEMENTS FOR STUDYING THE DISTRIBUTION OF AIR POLLUTANTS IN THE SURROUNDINGS OF AN EMISSION SOURCE

METHOD FOR THE QUANTITATIVE DETERMINATION OF ELEMENTS FOR STUDYING THE DISTRIBUTION OF AIR POLLUTANTS IN THE SURROUNDINGS OF AN EMISSION SOURCE

机译:排放源周围空气污染物分布的元素定量测定方法

摘要

It is an object of the present invention to a kind of for quantitatively determining the emission source of Air pollutant of the element for studying distribution. The method is characterized in that following steps: specimen inspection is collected in sampling plot from above-mentioned vegetation around emission source, and with sample from surface layer part, the sampling plot of that side is which surface emitting source; Sample is dried; The surface of sample is formed into conductive; The use on sample surfaces of the element of the content can dissipate X-ray microanalysis instrument measurement (EDX) and scanning electron microscope (SEM).
机译:本发明的一个目的是一种用于定量确定用于研究分布的元素的空气污染物的排放源的类型。该方法的特征在于,按以下步骤进行:从上述发射源周围的植被的采样区采集标本,并从表层部分采集样品,该侧的采样区是哪个表面发射源。样品干燥;样品表面形成导电性;在样品表面上使用该元素的含量可以消散X射线微分析仪测量(EDX)和扫描电子显微镜(SEM)。

著录项

  • 公开/公告号EP0950182A1

    专利类型

  • 公开/公告日1999-10-20

    原文格式PDF

  • 申请/专利权人 HELSINKI UNIVERSITY LICENSING LTD. OY;

    申请/专利号EP19980900081

  • 发明设计人 HAAPALA HEIKKI;

    申请日1998-01-02

  • 分类号G01N23/00;G01N23/223;

  • 国家 EP

  • 入库时间 2022-08-22 02:17:42

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