BIPHASE CLOCK DETECTING CIRCUIT IN THE ATIP DECODING APPARATUS

• 1. 时钟延迟检测电路及利用时钟延迟检测电路的半导体装置 [P] . 中国专利： CN104283556B . 2019.02.22
• 2. 时钟延迟检测电路及利用时钟延迟检测电路的半导体装置 [P] . 中国专利： CN104283556A . 2015-01-14
• 3. Biphase clock extraction circuit in ATIP decoding apparatus [P] . 韩国专利： KR940001126A . 1994-01-10

  机译： ATIP解码装置中的双相时钟提取电路

• 4. Method and related circuit for generating a wobble clock and an ATIP clock through a reference clock and a wobble signal [P] . 美国专利： US7016284B2 . 2006-03-21

  机译： 通过参考时钟和摆动信号产生摆动时钟和atip时钟的方法及相关电路

• 5. PHASE-MODULATED DECODE CLOCK GENERATING CIRCUIT, PHASE INVERSION DETECTING CIRCUIT, PHASE INVERSION PATTERN DETECTING CIRCUIT, DECODE CIRCUIT, AND PHASE-MODULATED SIGNAL REPRODUCING DEVICE FOR RECORDING MEDIUM HAVING PHASE-MODULATED SIGNAL [P] . 日本专利： JP2002124043A . 2002-04-26

  机译： 相位调制解码时钟生成电路，相位反转检测电路，相位反转图形检测电路，解码电路以及用于调制具有相调制信号的介质的相调制信号再现装置

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