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METHOD AND SYSTEM FOR INTRUDING LIQUID INTO FINE RECESS AND PLATING METHOD FOR FINE RECESS

机译:将液体引入精细过程的方法和系统以及精细过程的放置方法

摘要

PROBLEM TO BE SOLVED: To enable various liquids, e.g., plating liquid, to penetrate inside fine recesses. ;SOLUTION: This system for introducing liquid into fine recesses comprises a liquid-containing means 20 for introducing a plating liquid, such that the surface at a part of a semiconductor wafer 100 provided with fine recesses 101 touches the plating liquid, a means 70 for heating residual gas in the fine recesses 101 of the semiconductor wafer 100, and a means 50 for controlling the pressure of the plating liquid introduced into the liquid-containing means 20 at a specified level. After the plating liquid has been introduced into the liquid-containing means 20, residual gas in the fine recess 101 is heated by the heating means 70 and the plating liquid filled in the liquid containing means 20 is at the same time pressurized by the pressure control means 50. Subsequently, residual gas in the fine recesses 101 is expanded and driven out therefrom, by reducing the pressure of the plating liquid through the pressure control means 50 and the plating liquid is made to penetrate.;COPYRIGHT: (C)1999,JPO
机译:要解决的问题:使各种液体(例如电镀液)渗入细小的凹槽内。 ;解决方案:该用于将液体引入细小凹陷的系统包括用于引入电镀液的含液装置20,以使半导体晶片100的设置有细小凹陷101的部分表面与电镀液接触,该装置70用于加热半导体晶片100的细小凹部101中的残留气体,以及用于将引入到液体容纳装置20中的电镀液的压力控制在规定水平的装置50。在将电镀液引入到液体容纳装置20中之后,细小凹部101中的残留气体被加热装置70加热,并且通过压力控制同时对填充在液体容纳装置20中的电镀液进行加压。随后,通过经由压力控制装置50降低镀液的压力,使细凹部101中的残留气体膨胀并从中驱除,并使镀液渗透。;版权:(C)1999,日本特许厅

著录项

  • 公开/公告号JPH1187273A

    专利类型

  • 公开/公告日1999-03-30

    原文格式PDF

  • 申请/专利权人 EBARA CORP;

    申请/专利号JP19970252758

  • 申请日1997-09-02

  • 分类号H01L21/288;C23C18/31;

  • 国家 JP

  • 入库时间 2022-08-22 02:32:38

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