首页> 外国专利> METHOD AND SYSTEM FOR ANALYZING CURVED STATE OF STRUCTURE USING FINITE ELEMENT METHOD, AND RECORD MEDIUM RECORDED WITH CURVED STATE ANALYSIS PROGRAM OF THE STRUCTURE

METHOD AND SYSTEM FOR ANALYZING CURVED STATE OF STRUCTURE USING FINITE ELEMENT METHOD, AND RECORD MEDIUM RECORDED WITH CURVED STATE ANALYSIS PROGRAM OF THE STRUCTURE

机译：用有限元法分析结构弯曲状态的方法和系统，以及用该结构的弯曲状态分析程序记录的记录介质

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摘要

PROBLEM TO BE SOLVED: To analyze a curved state generated at a structure, before producing the structure without causing confusing at designing site. SOLUTION: Based on inputted structure data, the analytical model of the structure is constituted (S2). The finite element method analysis of the analytical model is executed under desired analytical conditions (S3) to detect the displacement of an analysis objective point at the curved analytic model (S4). The curvature of a curve to be generated at the analytic model is calculated (S5) from the displacement of the detected analysis objective point.

机译：解决的问题：在生产结构之前分析结构产生的弯曲状态而不会引起设计现场的混乱。解决方案：根据输入的结构数据，构造结构的分析模型（S2）。在所需的分析条件下执行分析模型的有限元方法分析（S3），以检测弯曲分析模型上分析目标点的位移（S4）。根据检测到的分析目标点的位移来计算（S5）要在解析模型处生成的曲线的曲率。

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公开/公告号JPH1185812A

专利类型
公开/公告日1999-03-30

原文格式PDF
申请/专利权人 NEC CORP;
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申请/专利号JP19970236130
发明设计人 ISHIBASHI MASAHIRO;
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申请日1997-09-01
分类号G06F17/50;G01B21/32;G06F17/00;H01L21/00;
国家 JP
入库时间 2022-08-22 02:32:53

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