首页> 外国专利> TANDEM MASS SPECTRAL ANALYSIS METHOD AND TANDEM MASS SPECTRAL ANALYZER

TANDEM MASS SPECTRAL ANALYSIS METHOD AND TANDEM MASS SPECTRAL ANALYZER

机译:串联质谱分析方法和串联质谱分析仪

摘要

PROBLEM TO BE SOLVED: To provide an effective method for operating a tandem mass analyzer and a device. ;SOLUTION: A parent ion generated from a sample is caused to pass a mass filter 2, is caused to collapse into daughter ions in a collapse means 3, and the daughter ions are caused to pass a non-continuous output mass analyzer such as a flight time analyzer 16, or the like. The mass to charge ratio range of a possible parent is divided into plural smaller ranges, and the mass filter 2 is set to pass the ions in the respective smaller ranges successively. Flags are set to the respective smaller ranges producing objective daughter ions, the mass filter 2 is set to pass the respective mass to charge ratios in the flag- set ranges, and the mass to charge ratio of produced collapsed ions against the respective mass to charge ratios can be determined using the non-continuous output mass analyzer 16.;COPYRIGHT: (C)1999,JPO
机译:要解决的问题:提供一种操作串联质量分析仪和设备的有效方法。 ;解决方案:使样品产生的母离子通过质量过滤器2,使其在塌陷装置3中塌陷为子离子,并使子离子通过非连续输出质量分析仪,例如飞行时间分析器16等。将可能的母体的质荷比范围分为多个较小的范围,并且将质量过滤器2设定为使各个较小范围的离子依次通过。将标记设置为产生目标子离子的各个较小范围,将质量过滤器2设置为使各个质荷比在标记设定的范围内通过,并且产生的塌缩离子的质荷比与各个荷质比比率可以使用非连续输出质量分析器16确定。版权所有:(C)1999,JPO

著录项

  • 公开/公告号JPH11154486A

    专利类型

  • 公开/公告日1999-06-08

    原文格式PDF

  • 申请/专利权人 MICROMASS LTD;

    申请/专利号JP19980253279

  • 发明设计人 BATEMAN ROBERT HAROLD;HOYES JOHN BRIAN;

    申请日1998-08-24

  • 分类号H01J49/26;H01J49/40;H01J49/42;

  • 国家 JP

  • 入库时间 2022-08-22 02:33:01

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