首页> 外国专利> SAMPLE OBSERVING AND ANALYZING METHOD BY VACUUM SYSTEM OBSERVING AND ANALYZING DEVICE, AND SAMPLE BOX FOR SAME DEVICE

SAMPLE OBSERVING AND ANALYZING METHOD BY VACUUM SYSTEM OBSERVING AND ANALYZING DEVICE, AND SAMPLE BOX FOR SAME DEVICE

机译:真空系统观察与分析装置的样品观察与分析方法及同一装置的样品盒

摘要

PROBLEM TO BE SOLVED: To enable highly accurate and high-quality observation and analysis while preventing the oxidization and moisture absorption of a sample in the observation and analysis of a sample such as metal lithium prepared by a sample preparing device and placed in the observa tion room of a vacuum observing analyzing device. ;SOLUTION: In a sample box 20, a lid plate 22 maintains closing air tightness at a recessed sample pocket 23 by the difference between the inner pressure and outer pressure of the pocket 23, and the lid plate 22 can be automatically opened by the energizing force of a spring by the equilibrium between the inner pressure and outer pressure of the pocket 23. The sample box 20 is placed in the glove box 5 of an atmosphere of inert gas of a sample preparing device 2 to house a sample 3 in the pocket 23. Continuously, the inside of the pocket 23 is brought into a vacuum state to set the pocket 23 at a closing hermetic state in which the lid 22 is adhered to the pocket 23. Then the sample box 20 is transferred to the observation room 9 of a vacuum system observing and analyzing device 1 and is set on a sample platform 11, and the observation room is brought into a vacuum state. By this, the lid 22 is brought into an automatically opened state, and the sample 3 in the pocket 23 is irradiated with an electron beam 12 and observed and analyzed characteristically in this observing and analyzing method and the sample box 20.;COPYRIGHT: (C)1999,JPO
机译:解决的问题:在进行由样品制备装置制备并放置在观察台中的样品(例如金属锂)的观察和分析过程中,在防止样品氧化和吸收水分的同时,实现高精度和高质量的观察和分析真空观测分析装置的空间。 ;解决方案:在样品盒20中,盖板22通过凹槽23的内部压力和外部压力之间的差来保持凹进的样品袋23的封闭气密性,并且通过通电可以自动打开盖板22通过袋23的内部压力和外部压力之间的平衡而产生的弹簧力。将样品盒20放置在样品制备装置2的惰性气体气氛的手套箱5中,以将样品3容纳在袋中23.接着,使容器23的内部成为真空状态,使容器23处于密闭状态,在该密闭状态下,将盖22粘贴在容器23上。然后,将样品盒20移送到观察室9。真空系统观察分析装置1设置在样品台11上,使观察室成为真空状态。由此,使盖22成为自动打开状态,对袋23内的样品3照射电子束12,并在该观察分析方法及样品盒20中进行特征性的观察和分析。 C)1999,日本特许厅

著录项

  • 公开/公告号JPH11201920A

    专利类型

  • 公开/公告日1999-07-30

    原文格式PDF

  • 申请/专利权人 ICHIKAWA TAKAYUKI;

    申请/专利号JP19980017837

  • 发明设计人 ICHIKAWA TAKAYUKI;

    申请日1998-01-13

  • 分类号G01N23/225;G01N1/28;G01N23/22;

  • 国家 JP

  • 入库时间 2022-08-22 02:36:37

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