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COSMIC RAY NEUTRON SOFTWARE ERROR RATE CALCULATION METHOD

机译:宇宙射线中子软件错误率计算方法

摘要

PROBLEM TO BE SOLVED: To provide an accurate guideline for manufacturing a semiconductor device which is strong against cosmic ray neutron software errors, by calculating the cosmic ray neutron software error rate of the semiconductor device based on a charge quantity collected on the surface of an element region from all small regions. ;SOLUTION: The element region of a semiconductor device is divided into a plurality of small regions in a depth direction, and a process of calculating a potential difference between each small region and the adjacent small regions is executed. Based on the potential difference, a process of calculating a probability that a carrier generated in each small region moves to the adjacent small regions by a cosmic ray neutron, a process of calculating a charge quantity collected on the surface of the element region by small region, by multiplying a probability that the carrier, which is generated in each small region by the cosmic ray neutron, reaches the surface of the element region by the charge quantity generated in each small region by the cosmic ray neutron, and a process of calculating the sum of the charge quantities collected on the surface of the element region by small region, are executed. Thus, the charge quantity collected on the surface of the element region from all the small regions can be accurately calculated.;COPYRIGHT: (C)1999,JPO
机译:要解决的问题:通过基于在元件表面收集的电荷量计算半导体器件的宇宙射线中子软件错误率,从而为制造抗宇宙射线中子软件错误的半导体器件提供准确的指导。来自所有小区域的区域。 ;解决方案:在深度方向上将半导体器件的元件区域划分为多个小区域,并执行计算每个小区域与相邻小区域之间的电势差的过程。基于该电位差,计算由宇宙射线中子在每个小区域中产生的载流子向相邻的小区域移动的概率的过程,计算由小区域在元素区域的表面上收集的电荷量的过程。通过将由宇宙射线中子在每个小区域中产生的载流子到达元素区域表面的概率乘以由宇宙射线中子在每个小区域中产生的电荷量,来计算元素的表面。执行小区域在元件区域的表面上收集的电荷量的总和。因此,可以准确地计算出从所有小区域收集到的元素区域表面上的电荷量。版权所有:(C)1999,JPO

著录项

  • 公开/公告号JPH11297952A

    专利类型

  • 公开/公告日1999-10-29

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP19980096511

  • 发明设计人 TOSAKA YOSHIHARU;KANEDA HIROYUKI;

    申请日1998-04-09

  • 分类号H01L27/108;H01L21/8242;G06F17/50;H01L29/00;

  • 国家 JP

  • 入库时间 2022-08-22 02:36:58

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