首页> 外国专利> APPARATUS AND METHOD FOR QUANTITATIVELY ANALYZING X-RAY AND MEDIUM FOR RECORDING X-RAY QUANTITATIVE ANALYSIS PROGRAM

APPARATUS AND METHOD FOR QUANTITATIVELY ANALYZING X-RAY AND MEDIUM FOR RECORDING X-RAY QUANTITATIVE ANALYSIS PROGRAM

机译:用于对X射线和介质进行定量分析以记录X射线定量分析程序的装置和方法

摘要

PROBLEM TO BE SOLVED: To simultaneously, accurately quantitatively analyze multi-elements in a short time irrespective of density of elements distributed in a sample. ;SOLUTION: An intensity of a characteristic X-ray 13 generated when emitting an electron beam 4 or X-ray to a sample 3 while scanning it is recorded at each element. A detected element and background are mapped based on it, subjected to a phase analysis, and grouped according to each composition. Further, mapped respective points are quantitatively calculated, and quantitative values of the respective groups are obtained. Further, an area ratio of the respective groups is obtained. Then, the ratio is converted into a weight ratio of each group based on the density of the detected element and the quantitative value of each group.;COPYRIGHT: (C)1998,JPO
机译:要解决的问题:要在短时间内同时准确定量分析多元素,而与样品中分布的元素密度无关。 ;解决方案:在扫描电子束4或X射线到样品3时,产生的特征X射线13的强度记录在每个元素上。根据检测到的元素和背景进行映射,进行相位分析,然后根据每种成分进行分组。此外,对映射的各个点进行定量计算,并且获得各个组的定量值。此外,获得各个组的面积比。然后,根据检测到的元素的密度和每组的定量值,将该比例转换为每组的重量比。;版权:(C)1998,JPO

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