首页> 外国专利> SEMICONDUCTOR MICROSCOPIC STRUCTURE FORMING METHOD, SEMICONDUCTOR ELEMENT FORMED USING IT RESONANT TUNNEL ELEMENT MANUFACTURE AND, RESONANT TUNNEL ELEMENT FORMED USING IT

SEMICONDUCTOR MICROSCOPIC STRUCTURE FORMING METHOD, SEMICONDUCTOR ELEMENT FORMED USING IT RESONANT TUNNEL ELEMENT MANUFACTURE AND, RESONANT TUNNEL ELEMENT FORMED USING IT

机译:半导体微观结构的形成方法,使用谐振隧道元件制造技术制造的半导体元件,以及使用谐振隧道元件制造技术制造的谐振隧道元件

摘要

PROBLEM TO BE SOLVED: To form a microscopic structure to be used for the quantum well of a resonant tunnel diode at low cost and high throughput by a method wherein a semiconductor layer is selectively etched using a mask pattern having the first and the second aperture parts utilizing lithographic technique. ;SOLUTION: A mask pattern 109, having the first and the second aperture parts, is formed on a substrate where a semiconductor layer is formed on the upper part. Then, using said mask pattern 109, a semiconductor microscopic structure 104, extending in the first direction in parallel with the surface of the substrate, is formed by selectively etching the semiconductor layer. In the etching process conducted at that time, the etching speed vertical to the first direction and the second direction in parallel with substrate surface is to be substantially zero against the etching speed of the first direction. The width of the semiconductor microscopic structure 104 should be substantially equal to the shortest distance in the second direction between the first aperture part and the second aperture part.;COPYRIGHT: (C)1997,JPO
机译:解决的问题:通过其中使用具有第一和第二开口部分的掩模图案选择性地蚀刻半导体层的方法,以低成本和高通量形成用于谐振隧道二极管的量子阱的微观结构。利用光刻技术。 ;解决方案:具有第一和第二开口部分的掩模图案109形成在基板上,在该基板上的上方形成半导体层。然后,使用所述掩模图案109,通过选择性地蚀刻半导体层来形成在第一方向上平行于基板的表面延伸的半导体微观结构104。在那时进行的蚀刻工艺中,相对于第一方向的蚀刻速度,垂直于第一方向和与基板表面平行的第二方向的蚀刻速度应基本为零。半导体微观结构104的宽度应基本上等于第一开口部分和第二开口部分之间在第二方向上的最短距离。;版权:(C)1997,JPO

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