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Process to minimize a seam in tungsten filled contact holes

机译:最小化钨填充接触孔中接缝的工艺

摘要

A process has been developed in which high aspect ratio contact holes, are filled with chemically vapor deposited tungsten plugs, exhibiting little or no seam at the center of the tungsten plug. The process features protection of the tungsten plug from the final removal and overetch steps, needed to remove residual tungsten from areas outside the contact hole. This is accomplished by delaying the residual removal procedure, until the tungsten plug is protected by an overlying interconnect metallization structure.
机译:已经开发出一种方法,其中高纵横比的接触孔填充有化学气相沉积的钨塞,在钨塞的中心几乎没有或没有接缝。该工艺具有保护钨塞不受最终去除和过度蚀刻步骤的影响,这些去除步骤是从接触孔外部去除残留钨所需的。这是通过延迟残留去除步骤来完成的,直到钨塞被上层互连金属化结构保护。

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