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Method for fabricating active devices on a thin membrane structure using porous silicon or porous silicon carbide

机译:使用多孔硅或多孔碳化硅在薄膜结构上制造有源器件的方法

摘要

A method for fabricating semiconductor device comprises the steps of providing a substrate formed from a semiconductor material of a first conductivity type and converting a selected portion of the substrate to a porous semiconductor material. This partially forms a membrane-like structure of non-porous semiconductor material on the substrate. The porous semiconductor material is then oxidized to form a rigid layer of oxide material under the partially formed membrane-like structure. After forming the porous oxide material one or more integrated circuit elements can be fabricated on the partially formed membrane-like structure without fracturing it because rigid layer of oxide material operates to support it during the fabrication of the integrated circuit elements. Once the integrated circuit elements are fabricated, all or part of the rigid layer of oxide material is removed to complete the membrane-like structure and allow it to deflect in response to a force applied thereto.
机译:一种用于制造半导体器件的方法,包括以下步骤:提供由第一导电类型的半导体材料形成的衬底,并将该衬底的选定部分转换为多孔半导体材料。这部分地在基板上形成无孔半导体材料的膜状结构。然后将多孔半导体材料氧化以在部分形成的膜状结构下形成氧化物材料的刚性层。在形成多孔氧化物材料之后,一个或多个集成电路元件可以被制造在部分形成的膜状结构上而不会破裂,这是因为氧化物材料的刚性层在集成电路元件的制造过程中起着支撑它的作用。一旦集成电路元件被制造,氧化物材料的刚性层的全部或部分被去除以完成膜状结构并使其响应于施加到其上的力而偏转。

著录项

  • 公开/公告号US5604144A

    专利类型

  • 公开/公告日1997-02-18

    原文格式PDF

  • 申请/专利权人 KULITE SEMICONDUCTOR PRODUCTS INC.;

    申请/专利号US19950444962

  • 发明设计人 ANTHONY D. KURTZ;

    申请日1995-05-19

  • 分类号H01L21/265;

  • 国家 US

  • 入库时间 2022-08-22 03:10:35

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