Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit

• 1. 可移动单元体玻璃幕墙悬臂式吊装设备 [P] . 中国专利： CN109279522A . 2019-01-29
• 2. 光读取单元、信息处理设备及信息再现方法 [P] . 中国专利： CN1324588C . 2007.07.04
• 3. Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit [P] . 欧洲知识产权局专利： EP0791803B1 . 2002-01-09

  机译： 悬臂单元和使用该悬臂单元的原子力显微镜，磁力显微镜，再现设备和信息处理设备

• 4. CANTILEVER UNIT AND ATOMIC FORCE MICROSCOPE, MAGNETIC FORCE MICROSCOPE, REPRODUCING APPARATUS AND INFORMATION PROCESSING APPARATUS USING THE CANTILEVER UNIT [P] . CA2065593C . 1999-01-19

  机译： 悬臂单元和原子力显微镜，磁力显微镜，再现设备以及使用悬臂单元的信息处理设备

• 5. Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit [P] . 欧洲知识产权局专利： EP0791803A2 . 1997-08-27

  机译： 悬臂单元和使用该悬臂单元的原子力显微镜，磁力显微镜，再现设备和信息处理设备

• 1. Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope [J] . Sangmin An, Baekman Sung, Haneol Noh, 纳微快报：英文版 . 2014,第001期
• 2. Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment [J] . 阳丽, 涂育松, 谭惠丽 应用数学和力学（英文版） . 2014,第005期
• 3. Nanomanipulator based on a high-speed atomic force microscope capable of controlling a cantilever loading force using a magnetic solenoid [C] . Kohei Iwasaki, Yuki Takeda, Futoshi Iwata International Symposium on Micro-NanoMechatronics and Human Science . 2016
• 4. Three-dimensional measurement of atomic force microscope cantilever deformation to determine the three-dimensional applied force vector. [D] . Kumanchik, Lee. 2010
• 5. Dynamic response of a cracked atomic force microscope cantilever used for nanomachining [O] . Haw-Long Lee, Win-Jin Chang 2012
• 6. Viscoelastic Measurements of Single Molecules on a Millisecond Time Scale by Magnetically Driven Oscillation of an Atomic Force Microscope Cantilever [O] . -1

• 1. The Use of Light Diffracted from Grating Etched onto the Backside Surface of an Atomic Force Microscope Cantilever Increases the Force Sensitivity [J] . Sergey K. Sekatskii ,Mounir Mensi ,Andrey G. Mikhaylov . 表面工程材料与先进技术期刊（英文） . 2013,第4期
• 2. Joint Operation of Atomic Force Microscope and Advanced Laser Confocal Microscope for Observing Surface Processes in a Protein Crystal [J] . Shin-ichiro Yanagiya ,Nobuo Goto . 表面工程材料与先进技术期刊（英文） . 2012,第3期
• 3. Constant Force Feedback Controller Design Using PID-Like Fuzzy Technique for Tapping Mode Atomic Force Microscopes [J] . Yuan-Jay Wang . 智能控制与自动化（英文） . 2013,第3期
• 4. 原子力显微镜梯度微悬臂梁的振动分析 [C] . 梁利娜 ,柯燎亮 ,汪越胜 . 北京力学会第二十二届学术年会 . 2016
• 5. 基于F-P干涉的原子力显微镜微悬臂偏移检测系统的研究 [A] . 詹维纳 . 2017