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METHOD FOR INVESTIGATION OF TOPOLOGY OF DIELECTRIC SURFACE BY MEANS OF SCANNING TUNNEL MICROSCOPY
METHOD FOR INVESTIGATION OF TOPOLOGY OF DIELECTRIC SURFACE BY MEANS OF SCANNING TUNNEL MICROSCOPY
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机译:扫描隧道显微镜研究介电表面拓扑的方法
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摘要
FIELD: scanning tunnel microscopy. SUBSTANCE: method involves preliminary application of material to be investigated on surface of conducting substrate. Material which work function of electrons is less than electron affinity energy in dielectric. Lanthanum hexaboride or yttrium hexaboride may be used as material for substrate. EFFECT: increased validity and quality of picture of investigated dielectric surface.
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