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FINITE ELEMENT ANALYSIS SUPPORT SYSTEM, AND METHOD AND DEVICE FOR FINITE ELEMENT ANALYSIS

机译:有限元分析支持系统,有限元分析方法和装置

摘要

PURPOSE: To efficiently input and analyze element sizes of a finite element model. CONSTITUTION: An initial analytic result obtained by a shape model generation part 101, a finite element model generation part 102, a finite element analysis part 103, and an error evaluation part 104 is inputted to an element size setting part 105, and an error area generated through error evaluation is displayed and an error area to be analyzed in detail is interactively selected. An element size required for a detailed analysis is inputted and the finite element model is automatically generated again and the analysis is performed on the basis of this information. An analytic model which is made larger in element density only in an aimed error area can easily be generated and the calculation time for the analysis is shortened.
机译:目的:有效输入和分析有限元模型的单元尺寸。构成:将形状模型生成部101,有限元模型生成部102,有限元分析部103和误差评估部104获得的初始分析结果输入到要素尺寸设定部105和误差区域中显示通过错误评估生成的错误,并交互选择要详细分析的错误区域。输入进行详细分析所需的元素尺寸,并再次自动生成有限元模型,并根据此信息进行分析。可以容易地生成仅在目标误差区域中元素密度较大的解析模型,并且可以缩短分析的计算时间。

著录项

  • 公开/公告号JPH08153130A

    专利类型

  • 公开/公告日1996-06-11

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP19940293150

  • 发明设计人 YOKOHARI TAKASHI;NISHIGAKI ICHIRO;

    申请日1994-11-28

  • 分类号G06F17/50;G06F17/00;

  • 国家 JP

  • 入库时间 2022-08-22 04:03:25

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