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COUNCIL FOR MEASURING THE LIGHT LIGHT LIGHT LONGS BY HEADLESS AFTER INTERFERENCE.

机译：通过无干扰的无光测量光长的理事会。

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摘要

The wavelength ( lambda ) of light to be measured is determined in accordance with the formula lambda = Ds/N from the number (N) of interference fringes having predetermined repeating waveforms that occur when the optical path length is changed by the quantity Ds by moving continuously a movable portion (7) of an interference spectrometer portion (1) of a wavelength measuring apparatus at a constant speed. A wave number counter (13) counts the number of specific points in each period of the interference fringes entirely from a predetermined measuring start point to a predetermined measuring finish point to obtain wave number data (Na). A reference pulse generation portion (21) generates reference pulses having a higher frequency than the repeating waveforms of the interference fringes. Detection portions (22a, 23a) detect the first number of the reference pulses existing in one period of the interference fringes, the second number of the reference pulses existing inside the period from the measuring start point till the first specific point of the interference fringes in succession to the measuring start point and the third number of the reference pulses existing inside the period from the final specific point of the interference fringes to the measuring finish point. A calculation portion (26) corrects the wave number data (Na) to wave number data (NA) inclusive of fraction values using the first, second and third numbers, and measures highly precisely the wavelength of light to be measured in accordance with the following equation: lambda = Ds/NA.

机译：由具有预定重复波形的干涉条纹的数量（N）根据公式λ＝ Ds / N确定待测光的波长（λ），所述干涉条纹具有预定的重复波形，当光程长度通过移动而改变量Ds时出现波长测量装置的干涉光谱仪部分（1）的可移动部分（7）以恒定速度连续地移动。波数计数器（13）对干涉条纹的每个周期中从预定测量起点到预定测量结束点的特定点的总数进行计数，以获得波数数据（Na）。参考脉冲产生部分（21）产生具有比干涉条纹的重复波形更高的频率的参考脉冲。检测部（22a，23a）检测存在于干涉条纹的一个周期内的第一数量的参考脉冲，存在于从测量开始点到干涉条纹的第一特定点的周期内的第二数量的参考脉冲。从干涉条纹的最终特定点到测量结束点的时间间隔内存在的测量脉冲的第三个数量。计算部分（26）使用第一，第二和第三数字将波数数据（Na）校正为包括分数值的波数数据（NA），并根据以下内容高精度地测量要测量的光的波长等式：λ＝ Ds / NA。

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公开/公告号DE69110230D1

专利类型
公开/公告日1995-07-13

原文格式PDF
申请/专利权人 ANRITSU CORP. TOKIO/TOKYO JP;NIPPON TELEGRAPH AND TELEPHONE CORP. TOKIO/TOKYO JP;
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申请/专利号DE19916010230T
发明设计人 TAMURA YOUICHI B-201 YATOH HAITSU ATSUGI-SHI KANAGAWA-KEN 243 JP;GOTO HIROSHI 661-1-401 ISHIDA KANAGAWA-KEN 259-11 JP;TSUKAMOTO TAKESHI C-105 882-1 TSURUMAKI KANAGAWA-KEN 257 JP;ICHIHASHI YASUTAKA 3-20-1 HINODE-CHO KANAGAWA-KEN 238 JP;IMAI TAKAMASA 2-1-3-2-303 HAYASHI KANAGAWA-KEN 238-03 JP;
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申请日1991-03-26
分类号G01J9/02;
国家 DE
入库时间 2022-08-22 04:07:54

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