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absorptionsmikroskopie and / or spectroscopy with abtastmikroskopiesteuerung.
absorptionsmikroskopie and / or spectroscopy with abtastmikroskopiesteuerung.
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机译：吸收光谱和/或光谱分析与原子吸收光谱法。
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摘要
High resolution absorption microscopy, spectroscopy and similar applications are implemented by providing for a measurement tip (21) which is maintained spaced from a sample (10) under investigation sufficiently close so as to equalize thermal levels in the tip (21) and the sample (10); generally within about 1 nm. Energy is applied to the sample (10) being investigated and either a steady state or dynamic junction potential is measured. The close separation can be maintained by techniques employed in scanning tunneling microscopy, atomic force microscopy or capacitance microscopy. In the event the close separation is maintained using scanning tunneling microscopy techniques, then a switching arrangement (30) is provided for connecting a conductive film (11) (either of the sample (10) or supported on a sample (10)) to either a suitable potential or ground and simultaneously connecting the STM tip (21) either in a feedback loop or to a device for measuring the junction potential. The feedback loop, in addition to conventional operational amplifier components, includes a sample and hold element (55) to maintain the input voltage to an operational amplifier (23) in the feedback loop during those times that the measurement tip (21) is connected to the junction potential measurement device, as opposed to being connected in the STM feedback loop. The spectroscopy application uses similar architecture, although the energy source (15) is tunable.
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