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Method and apparatus for absolute measurement of force by use of polarized, non-coherent light and compensation of strain-induced birefringence effects in a single mode-fiber optic waveguide

机译:通过使用偏振非相干光绝对测量力并补偿单模光纤波导中的应变引起的双折射效应的方法和设备

摘要

The present invention discloses a method and an apparatus which enables one to obtain definite non-modulo-2-dependent measurements wherein a method for the fiber-optic measurement of force, which is based upon the strain-induced birefringence of a single-mode light waveguide, provides a compensation method for the phase differences of two linear modes of the exiting light waves, which are caused by the force acting on the light waveguide and the consequent change in birefringence. In one embodiment of the method, a liquid crystal cell, the birefringence effect of which can be controlled electrically, is used as a compensation element. The maximum of an autocorrelation function, which occurs as an image, and the respective voltage at the liquid crystal cell, are evaluated as a measurement for the birefringence which is to be compensated for and, accordingly, for the effective force. In an alternate embodiment of the method, the two partial waves are directed transversely relative to the propagation direction of the wave fronts by an optical component with linearly space-dependent birefringence. The autocorrelation function can then be obtained as a spatial coordinate and can be plotted electronically by a line detector such as a line array. The location of the maximum of the autocorrelation function is, under certain defined conditions, a measurement for the birefringence which is caused in the light waveguide by mechanical tension from which the magnitude of the force, which acts on the force sensor, can be calculated.
机译:本发明公开了一种方法和设备,该方法和设备能够获得确定的非模2依赖性测量,其中一种用于光纤的力测量方法,该方法基于应变引起的单模光的双折射。波导提供了一种补偿方法,用于补偿出射光波的两个线性模式的相位差,这是由作用在光波导上的力以及随之而来的双折射变化引起的。在该方法的一个实施例中,可以将其双折射效应可以电控的液晶盒用作补偿元件。作为图像出现的自相关函数的最大值以及在液晶单元处的相应电压被评估为用于双折射的测量,该双折射将被补偿,并且因此被补偿为有效力。在该方法的替代实施例中,两个分波通过具有线性空间相关双折射的光学组件相对于波前的传播方向横向地定向。然后,可以将自相关函数作为空间坐标获得,并可以通过线检测器(例如线阵列)以电子方式对其进行绘制。在某些确定的条件下,自相关函数的最大值的位置是对双折射的测量,该双折射是由机械张力在光波导中引起的,由此可以计算作用在力传感器上的力的大小。

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