首页> 外国专利> METHOD AND DEVICE FOR DETERMINING IMPURITIES IN A GAS BY GAS PHASE CHROMATOGRAPHY AND USE FOR CALIBRATION OF DOPANT IMPURITIES IN SILANE.

METHOD AND DEVICE FOR DETERMINING IMPURITIES IN A GAS BY GAS PHASE CHROMATOGRAPHY AND USE FOR CALIBRATION OF DOPANT IMPURITIES IN SILANE.

机译:用气相色谱法测定气体中杂质的方法和装置,以及用于校准硅烷中杂质杂质的方法。

摘要

The device for determining impurities in a gas by gas phase chromatography comprises: … …  - a device (2) for cryogenic trapping of the impurities, equipped with a column packed with granules of a product which adsorbs the impurities, means for refrigeration capable of maintaining the column at a low temperature during the passage of the gas carrying impurities and means for reheating with a view to subsequent desorption; …  - a first gas phase chromatograph (15) with a view to a preliminary analysis, equipped with a column with a packing 17, 18, 19 for each impurity; …  - a device (32) for cryogenic recentring of the impurities, equipped with a capillary column, means for refrigeration capable of maintaining the column at low temperature during the passage of a carrier gas which has passed through the first chromatograph (15) and means for desorption reheating; … and a second gas phase chromatograph (34) equipped with a capillary column 36, a detection device (38) being placed at the exit. …IMAGE…
机译:用于通过气相色谱法测定气体中杂质的装置包括:......-用于低温捕集杂质的装置(2),该装置装有装有吸附了杂质的产品颗粒的柱子,该制冷装置能够保持在携带杂质的气体通过的过程中,该柱处于低温状态,以及为了随后解吸而进行再加热的装置; …-为了初步分析的第一台气相色谱仪(15),其色谱柱配有针对每种杂质的填料17、18、19; …-配备毛细管柱的用于杂质低温冷冻的装置(32),该装置用于在已经通过第一色谱仪(15)的载气通过期间将柱保持在低温状态的制冷装置和装置用于解吸加热; ……以及配备有毛细管柱36的第二气相色谱仪(34),检测装置(38)放置在出口处。 …<图像>…

著录项

  • 公开/公告号FR2652417B1

    专利类型

  • 公开/公告日1993-12-03

    原文格式PDF

  • 申请/专利权人 AIR LIQUIDE;

    申请/专利号FR19890012447

  • 发明设计人 BRYSELBOUT FRANCIS;MAUVAIS PATRICK;

    申请日1989-09-22

  • 分类号G01N30/52;

  • 国家 FR

  • 入库时间 2022-08-22 04:34:00

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