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Dynamic random access memory with test function - reads out data from selected cells, performs logical operation processing to convert to lower number of data in test mode, and delays data output
Dynamic random access memory with test function - reads out data from selected cells, performs logical operation processing to convert to lower number of data in test mode, and delays data output
The DRAM has a data read-out (1-4) from each selected cell (11) of the numerous memory cells forming the memory with a test function. A data processor (5) performs a preset logic operation on the read-out data for converting them, in a test mode, into a smaller number of data than the read-out ones. A control delays the output time point for data from the processor in the test mode as compared with the normal operational mode. Pref. the data processor selects at least one datum from the selected data to transmit it in normal operating mode. ADVANTAGE - Prevents output of invalid data in test mode. Allows faster output of valid data for reduced access time in test mode.
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