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A semiconductor integrated circuit having a low power consumption voltage monitoring circuit for a built-in step-down voltage generator (a built-in step-down voltage generator for a low power consumption voltage monitoring circuit)
A semiconductor integrated circuit having a low power consumption voltage monitoring circuit for a built-in step-down voltage generator (a built-in step-down voltage generator for a low power consumption voltage monitoring circuit)
The semiconductor integrated circuit device of the present invention generates the internal reduction voltage Vint at the external voltage so as to selectively distribute the internal reduction voltage Vint and the external voltage to the circuit component and the reduction voltage generator 26 inside the circuit And two internal voltage generating circuits selectively enabled as the control signal Sdc for the standard data access mode and the burn-in test operation. The pre-monitoring circuit 24 of the circuit also activates the current mirror circuit 25a to generate the control signal Sdc when the external voltage Vext approaches the acceleration voltage range for the test operation, Thereby reducing the dash current in the standard data access mode.
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