Memory testing system with algorithmic test data generation

• 1. 一种测试数据生成方法及测试系统 [P] . 中国专利： CN101770423B . 2013.02.27
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• 3. Memory testing system with algorithmic test data generation [P] . 美国专利： US5357523A . 1994-10-18

  机译： 具有算法测试数据生成的内存测试系统

• 4. Memory testing system with algorithmic test data generation [P] . 欧洲知识产权局专利： EP0547682A2 . 1993-06-23

  机译： 具有算法测试数据生成的内存测试系统

• 5. Embedded testing circuit for testing e.g. static random access memory, has embedded data generation circuit generating internal test data pattern in response to external test data pattern, where external test data pattern is switchable [P] . 德国专利： DE102006054161A1 . 2007-05-31

  机译： 用于测试的嵌入式测试电路静态随机存取存储器，具有嵌入式数据生成电路，用于响应于外部测试数据模式而生成内部测试数据模式，其中外部测试数据模式是可切换的

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