首页> 外国专利> Pressure detecting circuit for semiconductor pressure sensor - has differential amplifier stage with zero drift compensation by temp.-dependent difference between base-emitter voltages

Pressure detecting circuit for semiconductor pressure sensor - has differential amplifier stage with zero drift compensation by temp.-dependent difference between base-emitter voltages

机译:半导体压力传感器的压力检测电路-具有差分放大器级,通过基极-发射极电压之间的温度相关差进行零漂移补偿

摘要

The pressure is measured in terms of the potential difference across one diagonal (3B-3C) of a resistance bridge (2A-2D) on a semiconductor chip with a signal processor (60) comprising a differential amplifier section, a bias current control section which sets the emitter currents of both transistors to produce an input-offset difference between their base-emitter voltages, and a power amplifier section. The temp. dependence of the input-offset voltage stabilises the null output voltage, and the conventional compensating resistance in parallel with one arm (2B) of the bridge is omitted. ADVANTAGE - Temp. dependence of null point output voltage is compensated without using resistance having small temp. coeffts.
机译:根据具有信号处理器(60)的半导体芯片上电阻桥(2A-2D)的一个对角线(3B-3C)上的电势差来测量压力,该信号处理器包括差分放大器部分,偏置电流控制部分,设置两个晶体管的发射极电流,以在其基极-发射极电压和功率放大器部分之间产生输入偏移差。温度输入失调电压的依赖性使零输出电压稳定,并且省略了与电桥的一个臂(2B)并联的常规补偿电阻。优势-温度零点输出电压的依赖关系得到补偿,而无需使用具有较小温度的电阻。系数。

著录项

  • 公开/公告号DE4311298A1

    专利类型

  • 公开/公告日1993-10-14

    原文格式PDF

  • 申请/专利权人 MITSUBISHI DENKI K.K. TOKIO/TOKYO JP;

    申请/专利号DE19934311298

  • 发明设计人 ARAKI TORU ITAMI HYOGO JP;

    申请日1993-04-06

  • 分类号G01L9/02;H01L23/58;G01D3/04;H01L27/20;

  • 国家 DE

  • 入库时间 2022-08-22 05:01:09

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号