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METHOD OF ELECTRON DIFFRACTOMETRIC INVESTIGATION, OF PHASE TRANSITION KINETICS IN THIN FILMS
METHOD OF ELECTRON DIFFRACTOMETRIC INVESTIGATION, OF PHASE TRANSITION KINETICS IN THIN FILMS
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机译:薄膜中电子相变研究的相变动力学研究
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摘要
SUMMARY OF THE INVENTION: investigated object is heated in electronograph and record one of the lines of its diffraction spectrum of wide-open slit. The gap width should exceed the width of the line together with its displacement during nagreva.2 yl.
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