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METHOD OF ELECTRON DIFFRACTOMETRIC INVESTIGATION, OF PHASE TRANSITION KINETICS IN THIN FILMS

机译:薄膜中电子相变研究的相变动力学研究

摘要

SUMMARY OF THE INVENTION: investigated object is heated in electronograph and record one of the lines of its diffraction spectrum of wide-open slit. The gap width should exceed the width of the line together with its displacement during nagreva.2 yl.
机译:发明概述:被研究的物体在电子照相仪中被加热并记录其大开缝的衍射谱线之一。间隙宽度应超过线的宽度及其在nagreva。2 yl期间的位移。

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