首页> 外国专利> PROCESS FOR CALIBRATING A THICKNESS TESTER AND THICKNESS TESTER FOR MEASURING THE THICKNESS OF OR MONITORING COATINGS, STRIPS, FILMS OR THE LIKE

PROCESS FOR CALIBRATING A THICKNESS TESTER AND THICKNESS TESTER FOR MEASURING THE THICKNESS OF OR MONITORING COATINGS, STRIPS, FILMS OR THE LIKE

机译:校准厚度测试仪和测量涂层,条带,薄膜或类似物的厚度的厚度测试仪的过程

摘要

The invention provides a method of calibrating an apparatus for measuring the thickness having, preferably, two displacement sensors (2, 3) operating by contact or without contact. Apparatus for measuring the thickness operate according to different measurement principles can, through this process, be calibrated easily, at the point where the measurement must be performed, this by means of a reference object (7).
机译:本发明提供一种校准用于测量厚度的设备的方法,该设备优选具有两个通过接触或不接触操作的位移传感器(2、3)。根据该不同的测量原理,用于测量厚度的设备可以通过该过程在必须进行测量的位置上容易地通过参考对象(7)进行校准。

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